no. 1
A software reliability growth model with two types of errors
RAIRO - Operations Research - Recherche Opérationnelle, Tome 19 (1985) no. 1, pp. 87-104 
@article{RO_1985__19_1_87_0,
     author = {Yamada, Shigeru and Osaki, Shunji and Narihisa, Hiroyuki},
     title = {A software reliability growth model with two types of errors},
     journal = {RAIRO - Operations Research - Recherche Op\'erationnelle},
     pages = {87--104},
     year = {1985},
     publisher = {EDP Sciences},
     volume = {19},
     number = {1},
     zbl = {0566.68029},
     language = {en},
     url = {https://www.numdam.org/item/RO_1985__19_1_87_0/}
}
TY  - JOUR
AU  - Yamada, Shigeru
AU  - Osaki, Shunji
AU  - Narihisa, Hiroyuki
TI  - A software reliability growth model with two types of errors
JO  - RAIRO - Operations Research - Recherche Opérationnelle
PY  - 1985
SP  - 87
EP  - 104
VL  - 19
IS  - 1
PB  - EDP Sciences
UR  - https://www.numdam.org/item/RO_1985__19_1_87_0/
LA  - en
ID  - RO_1985__19_1_87_0
ER  - 
%0 Journal Article
%A Yamada, Shigeru
%A Osaki, Shunji
%A Narihisa, Hiroyuki
%T A software reliability growth model with two types of errors
%J RAIRO - Operations Research - Recherche Opérationnelle
%D 1985
%P 87-104
%V 19
%N 1
%I EDP Sciences
%U https://www.numdam.org/item/RO_1985__19_1_87_0/
%G en
%F RO_1985__19_1_87_0
Yamada, Shigeru; Osaki, Shunji; Narihisa, Hiroyuki. A software reliability growth model with two types of errors. RAIRO - Operations Research - Recherche Opérationnelle, Tome 19 (1985) no. 1, pp. 87-104. https://www.numdam.org/item/RO_1985__19_1_87_0/

1. L. J. Bain, Statistical Analysis of Reliability and Life-Testing Models, Marcel Dekker, Inc., New York, 1978. | Zbl | MR

2. L. H. Crow, On Tracking Reliability Growth, Proc. 1975 Annu. Reliability and Maintainability Symp., 1975, pp. 438-443.

3. J. T. Duane, Learning Curve Approach to Reliability Monitoring, I.E.E.E. Trans. Aerosp., Vol. 2, 1964, pp. 563-566.

4. A. L. Goel, Software Error Detection Model with Applications, J. Syst. Software, Vol. 1, 1980, pp. 243-249.

5. A. L. Goel and K. Okumoto, Time-Dependent Error-Detection Rate Model for Software Reliability and Other Performance Measures, I.E.E.E. Trans. Reliab., Vol. R-28, 1979, pp. 206-211. | Zbl

6. Z. Jelinski and P. B. Moranda, Software Reliability Research, in Statistical Computer Performance Evaluation, W. FREIBERGER, Ed., Academic Press, New York, 1972, pp. 465-484.

7. W. Kremer, Birth-Death and Bug Counting, I.E.E.E. Trans. Reliab., Vol R-32, 1983, pp. 37-47. | Zbl

8. B. Littlewood, Theories of Software Reliability: How Good Are They and How Can They Be Improved?, I.E.E.E. Trans. Software Eng., Vol. SE-6, 1980, pp. 489-500.

9. P. B. Moranda, Event-Altered Rate Models for General Reliability Analysis, I.E.E.E. Trans. Reliab., Vol.R-28, 1979, p. 376-381. | Zbl

10. J. D. Musa, Software Reliability Measurement, J. Syst. Software, Vol. 1, 1980, p. 223-241. | Zbl

11. W. Nelson, Applied Life Data Analysis, John Wiley and Sons, Inc., New York, 1982. | Zbl | MR

12. M. Ohba and M. Kajiyama, Inflection S-shaped Software ReiiabUity Growth Model (in Japanese), I.RS.-Japan Proc. W.G.S.E. Meeting, Vol. 28, 1983.

13. C. V. Ramamoorthy and F. B. Bastani, Software Reliability - Status and Perspectives, I.E.E.E. Trans. Software Eng., Vol. SE-8, 1982, p. 354-371.

24. S. M. Ross, Stochastic Processes, John Wiley and Sons, Inc., New York, 1983. | Zbl | MR

15. G. J. Schick and R. W. Wolverton, An Analysis of Competing Software Reliability Models, I.E.E.E. Trans. Software Eng., Vol. SE-4, 1978, pp. 104-120. | Zbl

16. J. G. Shanthikumar, A State- and Time-Dependent Error Occurrence-Rate Software Reliability Model with Imperfect Debugging, Proc. 1981 Nat. Comput. Conf., 1981, pp. 311-315.

17. M. L. Shooman, Software Reliability: Measurement and Models, Proc. 1975 Annu. Reliability and Maintainability Symp., 1975, pp. 485-491. | Zbl

18. W. A. Jr. Thompson, On The Foundations of Reliability, Technometrics, Vol. 23 1981, pp. 1-13. | Zbl | MR

19. S. Yamada and S. Osaki, Software Reliability Growth Models and Their Comparisons (in Japanese), Trans. I.E.C.E. Japan, Vol. J65-D, 1982, pp. 906-912; also Systems. Computers. Controls, Vol. 13, 1982, pp. 42-49.

20. S. Yamada and S. Osaki, Reliability Growth Models for Hardware and Software Systems Based on Nonhomogeneous Poisson Processes: A Survey, Microelectron. Reliab., Vol. 23, 1983, pp. 91-112.

21. S. Yamada and S. Osaki, S-shaped Software Reliability Growth Models with Four Types of Software Error Data, Int.J. Systems Sci., Vol. 14, 1983, pp. 683-692. | Zbl