@article{RSA_1982__30_2_5_0, author = {Vessereau, Andr\'e}, title = {Plans d'\'echantillonnage progressifs par attributs. Application aux plans normalis\'es MIL-STD 105 D}, journal = {Revue de Statistique Appliqu\'ee}, pages = {5--20}, publisher = {Soci\'et\'e de Statistique de France}, volume = {30}, number = {2}, year = {1982}, zbl = {0541.62087}, language = {fr}, url = {http://www.numdam.org/item/RSA_1982__30_2_5_0/} }
Vessereau, A. Plans d'échantillonnage progressifs par attributs. Application aux plans normalisés MIL-STD 105 D. Revue de Statistique Appliquée, Tome 30 (1982) no. 2, pp. 5-20. http://www.numdam.org/item/RSA_1982__30_2_5_0/
[1] Sequential analysis. John Wiley & Sons, London & New-York, (1947). | MR 20764 | Zbl 0029.15805
-[2] Sequential methods in statistics. Traduction française par P. Gabe "Méthodes séquentielles en statistique" Dunod, Paris (1969).
-[3] INDIAN STANDARD - IS.2500 (Part I). Inspection by attributes and by count of defects (1973).