TY  - JOUR
AU  - Nguyen, Hoai-Minh
AU  - Vogelius, Michael S.
TI  - A Representation Formula for the Voltage Perturbations Caused by Diametrically Small Conductivity Inhomogeneities. Proof of Uniform Validity
JO  - Annales de l'I.H.P. Analyse non linéaire
PY  - 2009
SP  - 2283
EP  - 2315
VL  - 26
IS  - 6
PB  - Elsevier
UR  - http://www.numdam.org/articles/10.1016/j.anihpc.2009.03.005/
DO  - 10.1016/j.anihpc.2009.03.005
LA  - en
ID  - AIHPC_2009__26_6_2283_0
ER  -